Thermal analysis and topographical characterization of latex films by scanning probe microscopy

Petri Ihalainen, Kaj Backfolk, Petri Sirvio, Jouko Peltonen

Tutkimustuotos: Lehtiartikkeli › Artikkeli › Tieteellinen › vertaisarvioitu

6 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Julkaisu	Journal of Applied Physics
Vuosikerta	101
Numero	4
DOI - pysyväislinkit	https://doi.org/10.1063/1.2429722
Tila	Julkaistu - 15 helmik. 2007
OKM-julkaisutyyppi	A1 Julkaistu artikkeli, soviteltu

Pääsy asiakirjaan

@article{f4c681c825a14c0baef937c9f64a688c,

title = "Thermal analysis and topographical characterization of latex films by scanning probe microscopy",

keywords = "latex films, atomic force microscopy (AFM), thermal and structural properties",

author = "Petri Ihalainen and Kaj Backfolk and Petri Sirvio and Jouko Peltonen",

year = "2007",

month = feb,

day = "15",

doi = "10.1063/1.2429722",

language = "English",

volume = "101",

journal = "Journal of Applied Physics",

issn = "0021-8979",

publisher = "American Institute of Physics",

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}

TY - JOUR

T1 - Thermal analysis and topographical characterization of latex films by scanning probe microscopy

AU - Ihalainen, Petri

AU - Backfolk, Kaj

AU - Sirvio, Petri

AU - Peltonen, Jouko

PY - 2007/2/15

Y1 - 2007/2/15

KW - latex films

KW - atomic force microscopy (AFM)

KW - thermal and structural properties

U2 - 10.1063/1.2429722

DO - 10.1063/1.2429722

M3 - Article

SN - 0021-8979

VL - 101

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 4

ER -