Thermal analysis and topographical characterization of latex films by scanning probe microscopy

Petri Ihalainen, Kaj Backfolk, Petri Sirvio, Jouko Peltonen

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)
Original languageEnglish
JournalJournal of Applied Physics
Volume101
Issue number4
DOIs
Publication statusPublished - 15 Feb 2007
MoE publication typeA1 Journal article-refereed

Keywords

  • latex films
  • atomic force microscopy (AFM)
  • thermal and structural properties

Cite this