CHARACTERIZATION OF THIN FILMS AND THEIR STRUCTURES IN SURFACE PLASMON RESONANCE MEASUREMENTS

JW SADOWSKI, IKJ KORHONEN, JPK PELTONEN

Tutkimustuotos: Lehtiartikkeli › Artikkeli › Tieteellinen › vertaisarvioitu

24 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Sivut	2581-2586
Julkaisu	Optical Engineering
Vuosikerta	34
Numero	9
Tila	Julkaistu - syysk. 1995
OKM-julkaisutyyppi	A1 Julkaistu artikkeli, soviteltu

Viittausmuodot

@article{42bfa88d42dc4f6bacdd3960906f8e61,

title = "CHARACTERIZATION OF THIN FILMS AND THEIR STRUCTURES IN SURFACE PLASMON RESONANCE MEASUREMENTS",

keywords = "SURFACE PLASMON RESONANCE, THIN METALLIC FILMS, COMPLEX INDEX OF REFRACTION, ATOMIC FORCE MICROSCOPE, FITTING",

author = "JW SADOWSKI and IKJ KORHONEN and JPK PELTONEN",

year = "1995",

month = sep,

language = "English",

volume = "34",

pages = "2581--2586",

journal = "Optical Engineering",

issn = "0091-3286",

publisher = "Society of Photo-optical Instrumentation Engineers",

number = "9",

}

TY - JOUR

T1 - CHARACTERIZATION OF THIN FILMS AND THEIR STRUCTURES IN SURFACE PLASMON RESONANCE MEASUREMENTS

AU - SADOWSKI, JW

AU - KORHONEN, IKJ

AU - PELTONEN, JPK

PY - 1995/9

Y1 - 1995/9

KW - SURFACE PLASMON RESONANCE

KW - THIN METALLIC FILMS

KW - COMPLEX INDEX OF REFRACTION

KW - ATOMIC FORCE MICROSCOPE

KW - FITTING

M3 - Article

SN - 0091-3286

VL - 34

SP - 2581

EP - 2586

JO - Optical Engineering

JF - Optical Engineering

IS - 9

ER -