Dynamic Test Case Prioritization in Industrial Test Result Datasets

Alina Torbunova, Per Erik Strandberg, Ivan Porres

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussaKonferenssiartikkeliTieteellinenvertaisarvioitu

Abstrakti

Regression testing in software development checks if new software features affect existing ones. Regression testing is a key task in
continuous development and integration, where software is built in small increments and new features are integrated as soon as
possible. It is therefore important that developers are notified about possible faults quickly. In this article, we propose a test case prioritization schema that combines the use of a static and a dynamic prioritization algorithm. The dynamic prioritization algorithm rearranges the order of execution of tests on the fly, while the tests are being executed. We propose to use a conditional probability
dynamic algorithm for this. We evaluate our solution on three industrial datasets and utilize Average Percentage of Fault Detection
for that. The main findings are that our dynamic prioritization algorithm can: a) be applied with any static algorithm that assigns
a priority score to each test case b) can improve the performance of the static algorithm if there are failure correlations between test
cases c) can also reduce the performance of the static algorithm, but only when the static scheduling is performed at a near optimal
level.
AlkuperäiskieliEnglanti
Otsikko5th ACM/IEEE International Conference on Automation of Software Test (AST 2024)
Sivumäärä4
DOI - pysyväislinkit
TilaJätetty - 2024
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
Tapahtuma5th ACM/IEEE International Conference on Automation of Software Test (AST 2024) - Lisbon, Portugal
Kesto: 15 huhtik. 202416 huhtik. 2024
https://conf.researchr.org/home/ast-2024

Konferenssi

Konferenssi5th ACM/IEEE International Conference on Automation of Software Test (AST 2024)
LyhennettäAST 2024
Maa/AluePortugal
KaupunkiLisbon
Ajanjakso15/04/2416/04/24
www-osoite

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