Topographical parameters for specifying a three-dimensional surface

J Peltonen, M Jarn, S Areva, M Linden, JB Rosenholm

Forskningsoutput: Tidskriftsbidrag › Artikel › Vetenskaplig › Peer review

116 Citeringar (Scopus)

Originalspråk	Engelska
Sidor (från-till)	9428-9431
Tidskrift	Langmuir
Volym	20
Nummer	22
DOI	https://doi.org/10.1021/la0400252
Status	Publicerad - 26 okt. 2004
MoE-publikationstyp	A1 Tidskriftsartikel-refererad

Åtkomst av dokument

@article{1e96d94a29d24a359ff765f85c8d0441,

title = "Topographical parameters for specifying a three-dimensional surface",

keywords = "atomic force microscopy (AFM), roughness parameters, Surface characteristics",

author = "J Peltonen and M Jarn and S Areva and M Linden and JB Rosenholm",

year = "2004",

month = oct,

day = "26",

doi = "10.1021/la0400252",

language = "English",

volume = "20",

pages = "9428--9431",

journal = "Langmuir",

issn = "0743-7463",

publisher = "American Chemical Society",

number = "22",

}

TY - JOUR

T1 - Topographical parameters for specifying a three-dimensional surface

AU - Peltonen, J

AU - Jarn, M

AU - Areva, S

AU - Linden, M

AU - Rosenholm, JB

PY - 2004/10/26

Y1 - 2004/10/26

KW - atomic force microscopy (AFM)

KW - roughness parameters

KW - Surface characteristics

U2 - 10.1021/la0400252

DO - 10.1021/la0400252

M3 - Article

SN - 0743-7463

VL - 20

SP - 9428

EP - 9431

JO - Langmuir

JF - Langmuir

IS - 22

ER -