THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY

J PELTONEN; M LINDEN; H FAGERHOLM; E GYORVARY; F ERIKSSON

THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY

J PELTONEN
, M LINDEN
, H FAGERHOLM
, E GYORVARY
, F ERIKSSON

Molekylärvetenskap och -teknik

Forskningsoutput: Tidskriftsbidrag › Artikel › Vetenskaplig › Peer review

39 Citeringar (Scopus)

Originalspråk	Engelska
Sidor (från-till)	88-91
Tidskrift	Thin Solid Films
Volym	242
Nummer	1-2
Status	Publicerad - 15 apr. 1994
MoE-publikationstyp	A1 Tidskriftsartikel-refererad

Citera det här

@article{6710e3ae88b0481c9799dd17923ee947,

title = "THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY",

keywords = "Langmuir monolayer, atomic force microscopy (AFM), xps",

author = "J PELTONEN and M LINDEN and H FAGERHOLM and E GYORVARY and F ERIKSSON",

year = "1994",

month = apr,

day = "15",

language = "English",

volume = "242",

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journal = "Thin Solid Films",

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AU - PELTONEN, J

AU - LINDEN, M

AU - FAGERHOLM, H

AU - GYORVARY, E

AU - ERIKSSON, F

PY - 1994/4/15

Y1 - 1994/4/15

KW - Langmuir monolayer

KW - atomic force microscopy (AFM)

KW - xps

M3 - Article

SN - 0040-6090

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JO - Thin Solid Films

JF - Thin Solid Films

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