Stability of environmentally friendly paper electronic devices

We have performed bias-stress measurements and determined the shelf-life of environmentally friendly paper electronic devices. We have utilized a low-voltage transistor that has a sorbitol-based ionic liquid as the electrolyte and a blend of poly(3-hexylthiophene) and poly(L-lactic acid) as the semi- conductor layer. The bias-stress measurements revealed that the devices operated below 1V are functioning without degradation, while above 1V an irreversible degradation process, probably due to water-induced oxidation of the semiconductor. A number of these devices are then used to create more complicated logic with, that is the operation of a NOR-gate and a one bit memory is demonstrated.