Reflection measurements to reveal the absorption in nanowire arrays

Nicklas Anttu; Azhar Iqbal; Magnus Heurlin; Lars Samuelson; Magnus T. Borgström; Mats-Erik Pistol; Arkady Yartsev

doi:10.1364/OL.38.001449

Reflection measurements to reveal the absorption in nanowire arrays

Nicklas Anttu^*
, Azhar Iqbal
, Magnus Heurlin
, Lars Samuelson
, Magnus T. Borgström
, Mats-Erik Pistol
, Arkady Yartsev

^*Korresponderande författare för detta arbete

Forskningsoutput: Tidskriftsbidrag › Artikel › Vetenskaplig › Peer review

11 Citeringar (Scopus)

Sammanfattning

The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

Originalspråk	Engelska
Sidor (från-till)	1449-1451
Antal sidor	3
Tidskrift	Optics Letters
Volym	38
Nummer	9
DOI	https://doi.org/10.1364/OL.38.001449
Status	Publicerad - 2013
Externt publicerad	Ja
MoE-publikationstyp	A1 Tidskriftsartikel-refererad

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title = "Reflection measurements to reveal the absorption in nanowire arrays",

abstract = "The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.",

author = "Nicklas Anttu and Azhar Iqbal and Magnus Heurlin and Lars Samuelson and Borgstr{\"o}m, \{Magnus T.\} and Mats-Erik Pistol and Arkady Yartsev",

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AU - Anttu, Nicklas

AU - Iqbal, Azhar

AU - Heurlin, Magnus

AU - Samuelson, Lars

AU - Borgström, Magnus T.

AU - Pistol, Mats-Erik

AU - Yartsev, Arkady

PY - 2013

Y1 - 2013

N2 - The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

AB - The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

UR - https://www.scopus.com/pages/publications/84877141419

U2 - 10.1364/OL.38.001449

DO - 10.1364/OL.38.001449

M3 - Article

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VL - 38

SP - 1449

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JO - Optics Letters

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Reflection measurements to reveal the absorption in nanowire arrays

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