TY - JOUR
T1 - LOW-ENERGY ELASTIC-SCATTERING OF ALPHA-PARTICLES FROM S-34, CR-50 AND NI-62
AU - BREDBACKA, A
AU - BRENNER, M
AU - Källman, Kjell-Mikael
AU - MANNGARD, P
AU - MATE, Z
AU - SZILAGYI, S
AU - ZOLNAI, L
PY - 1994
Y1 - 1994
N2 - Angular distributions of elastically scattered alpha particles were measured for the S-34, Cr-50 and Ni-62 target nuclei in the energy range 12.8-20.0 MeV. The experimental data were analysed using the phenomenological optical model with the Saxon-Woods form factor; in the case of S-34 the squared Saxon-Woods form factor was also applied. Phenomena such as the anomalous energy dependence of the potential near the Coulomb barrier, the discrete ambiguity problem, the low-mass and low-energy limit of applicability of the optical model are discussed using the real volume integral values obtained.
AB - Angular distributions of elastically scattered alpha particles were measured for the S-34, Cr-50 and Ni-62 target nuclei in the energy range 12.8-20.0 MeV. The experimental data were analysed using the phenomenological optical model with the Saxon-Woods form factor; in the case of S-34 the squared Saxon-Woods form factor was also applied. Phenomena such as the anomalous energy dependence of the potential near the Coulomb barrier, the discrete ambiguity problem, the low-mass and low-energy limit of applicability of the optical model are discussed using the real volume integral values obtained.
KW - S-34, CR-50, NI-62(ALPHA,ALPHA), E-ALPHA=12.8, 14.6, 16.3, 18.1 MEV
KW - S-34(ALPHA,ALPHA), E-ALPHA=20.0 MEV
KW - MEASURED SIGMA(E,THETA)
KW - ENRICHED TARGET
KW - SEMICONDUCTOR DETECTORS
KW - OPTICAL-MODEL ANALYSIS
KW - S-34, CR-50, NI-62(ALPHA,ALPHA), E-ALPHA=12.8, 14.6, 16.3, 18.1 MEV
KW - S-34(ALPHA,ALPHA), E-ALPHA=20.0 MEV
KW - MEASURED SIGMA(E,THETA)
KW - ENRICHED TARGET
KW - SEMICONDUCTOR DETECTORS
KW - OPTICAL-MODEL ANALYSIS
KW - S-34, CR-50, NI-62(ALPHA,ALPHA), E-ALPHA=12.8, 14.6, 16.3, 18.1 MEV
KW - S-34(ALPHA,ALPHA), E-ALPHA=20.0 MEV
KW - MEASURED SIGMA(E,THETA)
KW - ENRICHED TARGET
KW - SEMICONDUCTOR DETECTORS
KW - OPTICAL-MODEL ANALYSIS
M3 - Artikel
SN - 0375-9474
VL - 574
SP - 397
EP - 413
JO - Nuclear Physics A
JF - Nuclear Physics A
IS - 3
ER -