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3D label free bio-transfer standards

  • Miikka Järvinen
  • , Tuomas Vainikka
  • , Tapani Viitala
  • , Carlos Bermudez
  • , Roger Artigas
  • , Anton Nolvi
  • , Pol Martinez
  • , Niklas Sandler
  • , Edward Hæggström
  • , Ivan Kassamakov*
  • *Korresponderande författare för detta arbete

    Forskningsoutput: Kapitel i bok/konferenshandlingPublicerad konferensartikelVetenskapligPeer review

    Sammanfattning

    Two kinds of 3D label free Bio-Transfer-Standards (BTS) have been further developed at the University of Helsinki (UH). The first one, NanoRuler, is a staircase BTS featuring eight fatty acid bilayers which allows vertical calibration in the range of 5 to 40 nm. The second one, NanoStar, is a V-shaped BTS featuring two 5 nm tall bilayers that overlap at 10° angle. This standard enables the determination of the Instrument Transfer Function (ITF). A stability test was conducted on the BTSs, during which the standards were stored in laboratory conditions, and were profiled each week. Profiling was done using a custom-built Scanning White Light Interferometer (SWLI). The stability of NanoStar was ± 0.3 nm, and of NanoRuler ± 0.5 nm to ± 2.5 nm. The BTSs maintained their specified properties for at least six months and therefore allow vertical calibration and ITF determination. In addition, changes in surface morphology of one NanoRuler subjected to water immersion are presented. This paper reports intermediate findings during an ongoing stability test that will run for 24 months.

    OriginalspråkEngelska
    Titel på värdpublikationOptical Metrology and Inspection for Industrial Applications V
    RedaktörerToru Yoshizawa, Song Zhang, Sen Han, Sen Han
    FörlagSPIE, The International Society for Optical Engineering
    ISBN (elektroniskt)9781510622364
    ISBN (tryckt)9781510622364
    DOI
    StatusPublicerad - 2018
    MoE-publikationstypA4 Artikel i en konferenspublikation
    EvenemangOptical Metrology and Inspection for Industrial Applications V 2018 - Beijing, Kina
    Varaktighet: 11 okt. 201813 okt. 2018

    Publikationsserier

    NamnProceedings of SPIE - The International Society for Optical Engineering
    Volym10819
    ISSN (tryckt)0277-786X
    ISSN (elektroniskt)1996-756X

    Konferens

    KonferensOptical Metrology and Inspection for Industrial Applications V 2018
    Land/TerritoriumKina
    OrtBeijing
    Period11/10/1813/10/18

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