Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

Kim Nylund; Erik Östman; Dragos Truscan; Risto Teittinen

doi:10.1109/COMPSACW.2011.38

Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

Kim Nylund
, Erik Östman
, Dragos Truscan
, Risto Teittinen

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussa › Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

1 Sitaatiot (Scopus)

Alkuperäiskieli	Ei tiedossa
Otsikko	Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual
Toimittajat	SI Ahamed, D Bae, S Cha, CK Chang, R Subramanyan, E Wong, H Yang
Kustantaja	IEEE
Sivut	174–179
ISBN (elektroninen)	978-0-7695-4459-5
ISBN (painettu)	978-1-4577-0980-7
DOI - pysyväislinkit	https://doi.org/10.1109/COMPSACW.2011.38
Tila	Julkaistu - 2011
OKM-julkaisutyyppi	A4 Artikkeli konferenssijulkaisuussa
Tapahtuma	Computer Software and Applications Conference Workshops (COMPSACW) - 35th IEEE Computer Society Signature Conference on Computer, Software and Applications (COMPSAC 2011) Kesto: 18 heinäk. 2011 → 22 heinäk. 2011

Konferenssi

Konferenssi	Computer Software and Applications Conference Workshops (COMPSACW)
Ajanjakso	18/07/11 → 22/07/11

Pääsy asiakirjaan

10.1109/COMPSACW.2011.38

D-Mint: Deployment of Model-Based Technologies to Industrial Testing
Truscan, D. (Vastuullinen tutkija), Lilius, J. (CoPI), Porres Paltor, I. (CoPI) & Abbors, F. (CoI)
01/01/07 → 31/12/09
Projekti: Industry/Business Finland

Viittausmuodot

Nylund, K., Östman, E., Truscan, D., & Teittinen, R. (2011). Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing. teoksessa SI. Ahamed, D. Bae, S. Cha, CK. Chang, R. Subramanyan, E. Wong, & H. Yang (Toimittajat), Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual (Sivut 174–179). IEEE. https://doi.org/10.1109/COMPSACW.2011.38

@inproceedings{551347e44c83482d866aacccef371f53,

title = "Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing",

author = "Kim Nylund and Erik {\"O}stman and Dragos Truscan and Risto Teittinen",

note = "STA 2011 is to be held in conjunction with The 35th IEEE Computer Society Signature Conference on Computer, Software and Applications (COMPSAC 2011); Computer Software and Applications Conference Workshops (COMPSACW) ; Conference date: 18-07-2011 Through 22-07-2011",

year = "2011",

doi = "10.1109/COMPSACW.2011.38",

language = "Odefinierat/ok{\"a}nt",

isbn = "978-1-4577-0980-7",

pages = "174–179",

editor = "SI Ahamed and D Bae and S Cha and CK Chang and R Subramanyan and E Wong and H Yang",

booktitle = "Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual",

publisher = "IEEE",

}

Nylund, K, Östman, E, Truscan, D & Teittinen, R 2011, Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing. julkaisussa SI Ahamed, D Bae, S Cha, CK Chang, R Subramanyan, E Wong & H Yang (toim), Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual. IEEE, Sivut 174–179, Computer Software and Applications Conference Workshops (COMPSACW), 18/07/11. https://doi.org/10.1109/COMPSACW.2011.38

Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing. / Nylund, Kim; Östman, Erik; Truscan, Dragos et al.
Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual. toim. / SI Ahamed; D Bae; S Cha; CK Chang; R Subramanyan; E Wong; H Yang. IEEE, 2011. s. 174–179.

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussa › Konferenssiartikkeli › Tieteellinen › vertaisarvioitu

TY - GEN

T1 - Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

AU - Nylund, Kim

AU - Östman, Erik

AU - Truscan, Dragos

AU - Teittinen, Risto

N1 - STA 2011 is to be held in conjunction with The 35th IEEE Computer Society Signature Conference on Computer, Software and Applications (COMPSAC 2011)

PY - 2011

Y1 - 2011

U2 - 10.1109/COMPSACW.2011.38

DO - 10.1109/COMPSACW.2011.38

M3 - Publicerad konferensartikel

SN - 978-1-4577-0980-7

SP - 174

EP - 179

BT - Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual

A2 - Ahamed, SI

A2 - Bae, D

A2 - Cha, S

A2 - Chang, CK

A2 - Subramanyan, R

A2 - Wong, E

A2 - Yang, H

PB - IEEE

T2 - Computer Software and Applications Conference Workshops (COMPSACW)

Y2 - 18 July 2011 through 22 July 2011

ER -

Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

Konferenssi

Pääsy asiakirjaan

Projektit

D-Mint: Deployment of Model-Based Technologies to Industrial Testing

Viittausmuodot