THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY

J PELTONEN; M LINDEN; H FAGERHOLM; E GYORVARY; F ERIKSSON

THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY

J PELTONEN
, M LINDEN
, H FAGERHOLM
, E GYORVARY
, F ERIKSSON

Molekylääritieteen ja -tekniikan laboratorio

Tutkimustuotos: Lehtiartikkeli › Artikkeli › Tieteellinen › vertaisarvioitu

39 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Sivut	88-91
Julkaisu	Thin Solid Films
Vuosikerta	242
Numero	1-2
Tila	Julkaistu - 15 huhtik. 1994
OKM-julkaisutyyppi	A1 Julkaistu artikkeli, soviteltu

Viittausmuodot

@article{6710e3ae88b0481c9799dd17923ee947,

title = "THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY",

keywords = "Langmuir monolayer, atomic force microscopy (AFM), xps",

author = "J PELTONEN and M LINDEN and H FAGERHOLM and E GYORVARY and F ERIKSSON",

year = "1994",

month = apr,

day = "15",

language = "English",

volume = "242",

pages = "88--91",

journal = "Thin Solid Films",

issn = "0040-6090",

publisher = "Elsevier",

number = "1-2",

}

THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY. / PELTONEN, J; LINDEN, M; FAGERHOLM, H et al.
julkaisussa: Thin Solid Films, Vuosikerta 242, Nro 1-2, 15.04.1994, s. 88-91.

Tutkimustuotos: Lehtiartikkeli › Artikkeli › Tieteellinen › vertaisarvioitu

TY - JOUR

T1 - THE INFLUENCE OF MULTIVALENT SALTS ON THE PROCESSABILITY OF A STEARIC-ACID MONOLAYER - A STABILITY, ELECTRON-SPECTROSCOPY FOR CHEMICAL-ANALYSIS AND ATOMIC-FORCE MICROSCOPY STUDY

AU - PELTONEN, J

AU - LINDEN, M

AU - FAGERHOLM, H

AU - GYORVARY, E

AU - ERIKSSON, F

PY - 1994/4/15

Y1 - 1994/4/15

KW - Langmuir monolayer

KW - atomic force microscopy (AFM)

KW - xps

M3 - Article

SN - 0040-6090

VL - 242

SP - 88

EP - 91

JO - Thin Solid Films

JF - Thin Solid Films

IS - 1-2

ER -