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Round Robin test on bio-imaging transfer standard for 3D optical profilers

  • A. Nolvi
  • , T. Viitala
  • , A. García Pérez
  • , N. Sandler
  • , E. Hæggström
  • , C. Bermudez
  • , R. Artigas
  • , I. Kassamakov

    Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussaKonferenssiartikkeliTieteellinenvertaisarvioitu

    1 Sitaatiot (Scopus)

    Abstrakti

    A stair case height Bio-Transfer-Standard (BTS), developed and produced at the University of Helsinki (UH), was measured in two laboratories. The Round Robin test aims to determine whether BTS works with different optical profilers in different laboratories. First the artefact was measured at UH using a custom-built Scanning White Light Interferometer. Then BTS was measured at Sensofar-Tech, S.L. using an S-neox-type interferometer working either in Phase Shifting Interferometry mode or in Imaging Confocal Microscopy mode. To remove the influence of system calibration, a method featuring sample shifting and measurement subtraction was used. The BTS features eight lipid bilayer steps that each are 4.6 ± 0.1 nm tall on average. All 30 measurements done by four different operators at the two laboratories agree to within 0.1 nm which agrees with theoretical estimates and with measurements done using a surface plasmon resonance technique. The Round Robin results show the applicability of the newly developed bio-imaging transfer standard for calibrating 3D optical profilers.

    AlkuperäiskieliEnglanti
    OtsikkoPhotonic Instrumentation Engineering IV
    ToimittajatYakov G. Soskind, Craig Olson
    KustantajaSPIE, The International Society for Optical Engineering
    ISBN (elektroninen)9781510606616
    ISBN (painettu)9781510606616
    DOI - pysyväislinkit
    TilaJulkaistu - 2017
    OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
    TapahtumaPhotonic Instrumentation Engineering IV - San Francisco, California, United States
    Kesto: 28 tammik. 20172 helmik. 2017

    Julkaisusarja

    NimiProceedings of SPIE - The International Society for Optical Engineering
    Vuosikerta10110
    ISSN (painettu)0277-786X
    ISSN (elektroninen)1996-756X

    Konferenssi

    KonferenssiPhotonic Instrumentation Engineering IV
    Maa/AlueUnited States
    KaupunkiSan Francisco, California
    Ajanjakso28/01/1702/02/17

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