Round Robin test on bio-imaging transfer standard for 3D optical profilers

A. Nolvi, T. Viitala, A. García Pérez, N. Sandler, E. Hæggström, C. Bermudez, R. Artigas, I. Kassamakov

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussaKonferenssiartikkeliTieteellinenvertaisarvioitu

1 Sitaatiot (Scopus)

Abstrakti

A stair case height Bio-Transfer-Standard (BTS), developed and produced at the University of Helsinki (UH), was measured in two laboratories. The Round Robin test aims to determine whether BTS works with different optical profilers in different laboratories. First the artefact was measured at UH using a custom-built Scanning White Light Interferometer. Then BTS was measured at Sensofar-Tech, S.L. using an S-neox-type interferometer working either in Phase Shifting Interferometry mode or in Imaging Confocal Microscopy mode. To remove the influence of system calibration, a method featuring sample shifting and measurement subtraction was used. The BTS features eight lipid bilayer steps that each are 4.6 ± 0.1 nm tall on average. All 30 measurements done by four different operators at the two laboratories agree to within 0.1 nm which agrees with theoretical estimates and with measurements done using a surface plasmon resonance technique. The Round Robin results show the applicability of the newly developed bio-imaging transfer standard for calibrating 3D optical profilers.

AlkuperäiskieliEnglanti
OtsikkoPhotonic Instrumentation Engineering IV
ToimittajatYakov G. Soskind, Craig Olson
KustantajaSPIE, The International Society for Optical Engineering
ISBN (elektroninen)9781510606616
ISBN (painettu)9781510606616
DOI - pysyväislinkit
TilaJulkaistu - 2017
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
TapahtumaPhotonic Instrumentation Engineering IV - San Francisco, California, United States
Kesto: 28 tammik. 20172 helmik. 2017

Julkaisusarja

NimiProceedings of SPIE - The International Society for Optical Engineering
Vuosikerta10110
ISSN (painettu)0277-786X
ISSN (elektroninen)1996-756X

Konferenssi

KonferenssiPhotonic Instrumentation Engineering IV
Maa/AlueUnited States
KaupunkiSan Francisco, California
Ajanjakso28/01/1702/02/17

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