ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE

JPK PELTONEN, PS HE, JB ROSENHOLM

Tutkimustuotos: Lehtiartikkeli › Artikkeli › Tieteellinen › vertaisarvioitu

51 Sitaatiot (Scopus)

Alkuperäiskieli	Englanti
Sivut	7637-7642
Julkaisu	Journal of the American Chemical Society
Vuosikerta	114
Numero	20
Tila	Julkaistu - 23 syysk. 1992
OKM-julkaisutyyppi	A1 Julkaistu artikkeli, soviteltu

Viittausmuodot

@article{b3bb56e215094fec9f6eadc75dae93bb,

title = "ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE",

keywords = "atomic force microscopy (AFM), Langmuir-Blodgett film, defect",

author = "JPK PELTONEN and PS HE and JB ROSENHOLM",

year = "1992",

month = sep,

day = "23",

language = "English",

volume = "114",

pages = "7637--7642",

journal = "Journal of the American Chemical Society",

issn = "0002-7863",

publisher = "American Chemical Society",

number = "20",

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TY - JOUR

T1 - ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE

AU - PELTONEN, JPK

AU - HE, PS

AU - ROSENHOLM, JB

PY - 1992/9/23

Y1 - 1992/9/23

KW - atomic force microscopy (AFM)

KW - Langmuir-Blodgett film

KW - defect

M3 - Article

SN - 0002-7863

VL - 114

SP - 7637

EP - 7642

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

IS - 20

ER -