Artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves

Niklas Sandler; Johan Nyman

Artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves

Niklas Sandler (Keksijä), Johan Nyman (Keksijä)

Pharmacy

Tutkimustuotos: Patentti

Abstrakti

An artifact for determining resolution of imaging based on electromagnetic radiation, mechanical waves, or both is presented. The artifact includes a substrate and layers on top of the substrate. The layers include organic material and are stacked on each other in a partially overlapping way so that an edge of a first one of the layers is arranged to intersect with an edge of a second one of the layers. The layers constitute a three-dimensional surface topography where a groove defined by the edges of the first and second ones of the layers is tapering towards a point of intersection between the edges. The resolution is a minimum width of the tapering groove which is revealed by the imaging so that a pre-determined criterion is fulfilled.

Alkuperäiskieli	Englanti
Tila	Julkaistu - 2020
OKM-julkaisutyyppi	H1 Myönnetyt patentit

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Viittausmuodot

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title = "Artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves",

abstract = "An artifact for determining resolution of imaging based on electromagnetic radiation, mechanical waves, or both is presented. The artifact includes a substrate and layers on top of the substrate. The layers include organic material and are stacked on each other in a partially overlapping way so that an edge of a first one of the layers is arranged to intersect with an edge of a second one of the layers. The layers constitute a three-dimensional surface topography where a groove defined by the edges of the first and second ones of the layers is tapering towards a point of intersection between the edges. The resolution is a minimum width of the tapering groove which is revealed by the imaging so that a pre-determined criterion is fulfilled.",

author = "Niklas Sandler and Johan Nyman",

year = "2020",

language = "English",

type = "Patent",

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TY - PAT

T1 - Artifact for determining resolution of imaging based on electromagnetic radiation and/or mechanical waves

AU - Sandler, Niklas

AU - Nyman, Johan

PY - 2020

Y1 - 2020

N2 - An artifact for determining resolution of imaging based on electromagnetic radiation, mechanical waves, or both is presented. The artifact includes a substrate and layers on top of the substrate. The layers include organic material and are stacked on each other in a partially overlapping way so that an edge of a first one of the layers is arranged to intersect with an edge of a second one of the layers. The layers constitute a three-dimensional surface topography where a groove defined by the edges of the first and second ones of the layers is tapering towards a point of intersection between the edges. The resolution is a minimum width of the tapering groove which is revealed by the imaging so that a pre-determined criterion is fulfilled.

AB - An artifact for determining resolution of imaging based on electromagnetic radiation, mechanical waves, or both is presented. The artifact includes a substrate and layers on top of the substrate. The layers include organic material and are stacked on each other in a partially overlapping way so that an edge of a first one of the layers is arranged to intersect with an edge of a second one of the layers. The layers constitute a three-dimensional surface topography where a groove defined by the edges of the first and second ones of the layers is tapering towards a point of intersection between the edges. The resolution is a minimum width of the tapering groove which is revealed by the imaging so that a pre-determined criterion is fulfilled.

M3 - Patent

ER -