Analysis of trace elements in trunk wood by thick-target PIXE using dry ashing for preconcentration

Leo Harju, Jan-Olof Lill, Kjell-Erik Saarela, Sven-Johan Heselius, Fredrik Joachim Hernberg, Alf Lindroos

    Tutkimustuotos: LehtiartikkeliArtikkeliTieteellinenvertaisarvioitu

    32 Sitaatiot (Scopus)


    Thick-target Particle Induced X-ray Emission (TTPIXE) was used for the quantitative determination of trace-element concentrations in trunk wood. The wood samples were preconcentrated by dry ashing to improve the reliability of the sampling and the sensitivity of the analytical method. Samples of Scots pine (Pinus sylvestris) and Norway spruce (Picea abies) were collected from a polluted area (Harjavalta) as well as from a relatively nonpolluted area (Merimasku) in southwestern Finland. The elements studied were P, S, K, Ca, Mn, Fe, Ni, Cu, Pb, Rb, Sr, Ba, Cd and Ag. TTPIXE combined with dry ashing is a sensitive and reliable analytical technique for most elements studied. The method was validified by using several certified reference materials and also by ICP-MS analysis. Due to the low ash content (0.2-0.4%) in wood a high preconcentration factor can be obtained. Differences in trace-element uptake were observed between the two tree species studied. Trunk wood from the polluted area contained higher concentrations of heavy metal ions.
    AlkuperäiskieliEi tiedossa
    JulkaisuFresenius' Journal of Analytical Chemistry
    TilaJulkaistu - 1997
    OKM-julkaisutyyppiA1 Julkaistu artikkeli, soviteltu