3D label free bio-transfer standards

Miikka Järvinen, Tuomas Vainikka, Tapani Viitala, Carlos Bermudez, Roger Artigas, Anton Nolvi, Pol Martinez, Niklas Sandler, Edward Hæggström, Ivan Kassamakov*

*Tämän työn vastaava kirjoittaja

Tutkimustuotos: Artikkeli kirjassa/raportissa/konferenssijulkaisussaKonferenssiartikkeliTieteellinenvertaisarvioitu

Abstrakti

Two kinds of 3D label free Bio-Transfer-Standards (BTS) have been further developed at the University of Helsinki (UH). The first one, NanoRuler, is a staircase BTS featuring eight fatty acid bilayers which allows vertical calibration in the range of 5 to 40 nm. The second one, NanoStar, is a V-shaped BTS featuring two 5 nm tall bilayers that overlap at 10° angle. This standard enables the determination of the Instrument Transfer Function (ITF). A stability test was conducted on the BTSs, during which the standards were stored in laboratory conditions, and were profiled each week. Profiling was done using a custom-built Scanning White Light Interferometer (SWLI). The stability of NanoStar was ± 0.3 nm, and of NanoRuler ± 0.5 nm to ± 2.5 nm. The BTSs maintained their specified properties for at least six months and therefore allow vertical calibration and ITF determination. In addition, changes in surface morphology of one NanoRuler subjected to water immersion are presented. This paper reports intermediate findings during an ongoing stability test that will run for 24 months.

AlkuperäiskieliEnglanti
OtsikkoOptical Metrology and Inspection for Industrial Applications V
ToimittajatToru Yoshizawa, Song Zhang, Sen Han, Sen Han
KustantajaSPIE, The International Society for Optical Engineering
ISBN (elektroninen)9781510622364
ISBN (painettu)9781510622364
DOI - pysyväislinkit
TilaJulkaistu - 2018
OKM-julkaisutyyppiA4 Artikkeli konferenssijulkaisuussa
TapahtumaOptical Metrology and Inspection for Industrial Applications V 2018 - Beijing, China
Kesto: 11 lokak. 201813 lokak. 2018

Julkaisusarja

NimiProceedings of SPIE - The International Society for Optical Engineering
Vuosikerta10819
ISSN (painettu)0277-786X
ISSN (elektroninen)1996-756X

Konferenssi

KonferenssiOptical Metrology and Inspection for Industrial Applications V 2018
Maa/AlueChina
KaupunkiBeijing
Ajanjakso11/10/1813/10/18

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