Voltage dependent displacement current as a tool to measure the vacuum level shift caused by self-assembled monolayers on aluminum oxide

Mathias Nyman, Oskar Sandberg, Josué F. Martinez Hardigree, Srinivas Kola, Howard E. Katz, Ronald Österbacka

    Research output: Contribution to journalArticleScientificpeer-review

    5 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)
    Number of pages4
    JournalApplied Physics Letters
    Volume103
    Issue number24
    DOIs
    Publication statusPublished - 2013
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Aluminum oxide
    • Trapping
    • Charge transport
    • CELIV

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