Tracing the volcanic sources and differentiation of flood basalts using handheld XRF

Handheld (or portable) X-ray fluorescence (hXRF) technology has advanced significantly, enabling quality geochemical analysis in field conditions. We used a hXRF device (Olympus Vanta VMR-CCC-G3) to analyze major and trace elements in Jurassic continental flood basalts at Vestfjella, western Dronning Maud Land, Antarctica. Calibration was performed using basalt samples with existing laboratory XRF data. Samples were cut and polished at the research station, and multiple measurements were averaged per sample, with more detailed analysis for coarse-grained textures. Over 300 lava units were analyzed on-site. Semi-quantitative data were obtained for major and minor elements (Si, Ti, Al, Fe, Mn, Mg, Ca, K, P) and trace elements (V, Ni, Cu, Zn, Sr, Zr, Y). Co was excluded due to lack of standard data. Most elements showed rather low coefficient of within-sample variation <12 % (2 s), while Cr, Rb, and Ba showed higher variability (15–25 %). Some discrepancies in light elements such as Si and Al compared to lab data were attributed to sample heterogeneity, field conditions, and degradation of the hXRF window protective film, which was corrected using time-integrated factors. Elements such as Ti, P, Zr, Y, and Ni were key in distinguishing basalt types and tracing their volcanic sources and magmatic evolution. In addition, a previously unknown ferropicritic lava unit was discovered. This study demonstrates the potential of hXRF for semi-quantitative geochemical analysis and its value in guiding field-based petrological investigations, especially in remote environments where traditional sampling is limited.