Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

Kim Nylund; Erik Östman; Dragos Truscan; Risto Teittinen

doi:10.1109/COMPSACW.2011.38

Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

Kim Nylund, Erik Östman, Dragos Truscan, Risto Teittinen

Research output: Chapter in Book/Conference proceeding › Conference contribution › Scientific › peer-review

1 Citation (Scopus)

Original language	Undefined/Unknown
Title of host publication	Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual
Editors	SI Ahamed, D Bae, S Cha, CK Chang, R Subramanyan, E Wong, H Yang
Publisher	IEEE
Pages	174–179
ISBN (Electronic)	978-0-7695-4459-5
ISBN (Print)	978-1-4577-0980-7
DOIs	https://doi.org/10.1109/COMPSACW.2011.38
Publication status	Published - 2011
MoE publication type	A4 Article in a conference publication
Event	Computer Software and Applications Conference Workshops (COMPSACW) - 35th IEEE Computer Society Signature Conference on Computer, Software and Applications (COMPSAC 2011) Duration: 18 Jul 2011 → 22 Jul 2011

Conference

Conference	Computer Software and Applications Conference Workshops (COMPSACW)
Period	18/07/11 → 22/07/11

Access to Document

10.1109/COMPSACW.2011.38

D-Mint: Deployment of Model-Based Technologies to Industrial Testing
Truscan, D. (Principal Investigator), Lilius, J. (Co-Principal Investigator), Porres Paltor, I. (Co-Principal Investigator) & Abbors, F. (Co-Investigator)
01/01/07 → 31/12/09
Project: Industry/Business Finland

Cite this

Nylund, K., Östman, E., Truscan, D., & Teittinen, R. (2011). Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing. In SI. Ahamed, D. Bae, S. Cha, CK. Chang, R. Subramanyan, E. Wong, & H. Yang (Eds.), Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual (pp. 174–179). IEEE. https://doi.org/10.1109/COMPSACW.2011.38

@inproceedings{551347e44c83482d866aacccef371f53,

title = "Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing",

author = "Kim Nylund and Erik {\"O}stman and Dragos Truscan and Risto Teittinen",

note = "STA 2011 is to be held in conjunction with The 35th IEEE Computer Society Signature Conference on Computer, Software and Applications (COMPSAC 2011); Computer Software and Applications Conference Workshops (COMPSACW) ; Conference date: 18-07-2011 Through 22-07-2011",

year = "2011",

doi = "10.1109/COMPSACW.2011.38",

language = "Odefinierat/ok{\"a}nt",

isbn = "978-1-4577-0980-7",

pages = "174–179",

editor = "SI Ahamed and D Bae and S Cha and CK Chang and R Subramanyan and E Wong and H Yang",

booktitle = "Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual",

publisher = "IEEE",

}

Nylund, K, Östman, E, Truscan, D & Teittinen, R 2011, Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing. in SI Ahamed, D Bae, S Cha, CK Chang, R Subramanyan, E Wong & H Yang (eds), Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual. IEEE, pp. 174–179, Computer Software and Applications Conference Workshops (COMPSACW), 18/07/11. https://doi.org/10.1109/COMPSACW.2011.38

Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing. / Nylund, Kim; Östman, Erik; Truscan, Dragos et al.
Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual. ed. / SI Ahamed; D Bae; S Cha; CK Chang; R Subramanyan; E Wong; H Yang. IEEE, 2011. p. 174–179.

Research output: Chapter in Book/Conference proceeding › Conference contribution › Scientific › peer-review

TY - GEN

T1 - Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

AU - Nylund, Kim

AU - Östman, Erik

AU - Truscan, Dragos

AU - Teittinen, Risto

N1 - STA 2011 is to be held in conjunction with The 35th IEEE Computer Society Signature Conference on Computer, Software and Applications (COMPSAC 2011)

PY - 2011

Y1 - 2011

U2 - 10.1109/COMPSACW.2011.38

DO - 10.1109/COMPSACW.2011.38

M3 - Konferensbidrag

SN - 978-1-4577-0980-7

SP - 174

EP - 179

BT - Computer Software and Applications Conference Workshops (COMPSACW), 2011 IEEE 35th Annual

A2 - Ahamed, SI

A2 - Bae, D

A2 - Cha, S

A2 - Chang, CK

A2 - Subramanyan, R

A2 - Wong, E

A2 - Yang, H

PB - IEEE

T2 - Computer Software and Applications Conference Workshops (COMPSACW)

Y2 - 18 July 2011 through 22 July 2011

ER -

Towards Rapid Creation of Test Adaptation in On-line Model-Based Testing

Conference

Access to Document

Projects

D-Mint: Deployment of Model-Based Technologies to Industrial Testing

Cite this