Topographical parameters for specifying a three-dimensional surface

J Peltonen; M Jarn; S Areva; M Linden; JB Rosenholm

doi:10.1021/la0400252

Topographical parameters for specifying a three-dimensional surface

J Peltonen, M Jarn, S Areva, M Linden, JB Rosenholm

Laboratory of Molecular Science and Engineering

Research output: Contribution to journal › Article › Scientific › peer-review

116 Citations (Scopus)

Original language	English
Pages (from-to)	9428-9431
Journal	Langmuir
Volume	20
Issue number	22
DOIs	https://doi.org/10.1021/la0400252
Publication status	Published - 26 Oct 2004
MoE publication type	A1 Journal article-refereed

Keywords

atomic force microscopy (AFM)
roughness parameters
Surface characteristics

Access to Document

10.1021/la0400252

Cite this

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title = "Topographical parameters for specifying a three-dimensional surface",

keywords = "atomic force microscopy (AFM), roughness parameters, Surface characteristics",

author = "J Peltonen and M Jarn and S Areva and M Linden and JB Rosenholm",

year = "2004",

month = oct,

day = "26",

doi = "10.1021/la0400252",

language = "English",

volume = "20",

pages = "9428--9431",

journal = "Langmuir",

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publisher = "American Chemical Society",

number = "22",

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T1 - Topographical parameters for specifying a three-dimensional surface

AU - Peltonen, J

AU - Jarn, M

AU - Areva, S

AU - Linden, M

AU - Rosenholm, JB

PY - 2004/10/26

Y1 - 2004/10/26

KW - atomic force microscopy (AFM)

KW - roughness parameters

KW - Surface characteristics

U2 - 10.1021/la0400252

DO - 10.1021/la0400252

M3 - Article

SN - 0743-7463

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SP - 9428

EP - 9431

JO - Langmuir

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