The effects of metal impurities in poly[(2,5-bis(3-decylthiophen-2-yl)thieno[2,3-b]thiophene] on field-effect transistor properties

Niklas Björklund, Jan-Olof Lill, Johan Rajander, Ronald Österbacka, Steven Tierney, Martin Heeney, Iain McCulloch, Michael Cölle

    Research output: Contribution to journalArticleScientificpeer-review

    5 Citations (Scopus)

    Abstract

    We have used particle induced X-ray emission analysis and particle induced gamma-ray emission analysis to determine the elemental impurity concentrations in polyl(2,5-bis(3-decylthiophen-2-yl)thieno[2,3-b]thiophene] samples that have undergone different washing and extraction procedures to remove impurities. Field-effect transistors (FETs) were fabricated from the materials and their electrical characteristics show no significant differences between the devices made from different material samples. Reducing the metal residue levels below the ones measured in the starting material (300 mg/kg Fe, 7 mg/kg Zn. 3000 mg/kg Pd and 12000 mg/kg Sn) does not improve the FET performance. This suggests that it is not necessary to completely remove metal residues in the polymer for FET applications. (C) 2008 Elsevier B.V. All rights reserved.
    Original languageUndefined/Unknown
    Pages (from-to)215–221
    Number of pages7
    JournalOrganic Electronics
    Volume10
    Issue number2
    DOIs
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Field-effect transistor
    • Nuclear analysis
    • OFET
    • PIXE
    • Purity

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