The effects of metal impurities in poly[(2,5-bis(3-decylthiophen-2-yl)thieno[2,3-b]thiophene] on field-effect transistor properties

Niklas Björklund, Jan-Olof Lill, Johan Rajander, Ronald Österbacka, Steven Tierney, Martin Heeney, Iain McCulloch, Michael Cölle

    Research output: Contribution to journalArticleScientificpeer-review

    5 Citations (Scopus)
    Original languageUndefined/Unknown
    Pages (from-to)215–221
    Number of pages7
    JournalOrganic Electronics
    Volume10
    Issue number2
    DOIs
    Publication statusPublished - 2009
    MoE publication typeA1 Journal article-refereed

    Keywords

    • Field-effect transistor
    • Nuclear analysis
    • OFET
    • PIXE
    • Purity

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