Original language | English |
---|---|
Pages (from-to) | U274-U274 |
Journal | Abstracts of Papers of the American Chemical Society |
Volume | 219 |
Publication status | Published - 26 Mar 2000 |
MoE publication type | O2 Other |
Keywords
- atomic force microscopy (AFM)
JPK Peltonen, J Simola
Research output: Contribution to journal › Meeting Abstract › peer-review
Original language | English |
---|---|
Pages (from-to) | U274-U274 |
Journal | Abstracts of Papers of the American Chemical Society |
Volume | 219 |
Publication status | Published - 26 Mar 2000 |
MoE publication type | O2 Other |