Reflection measurements to reveal the absorption in nanowire arrays

Nicklas Anttu; Azhar Iqbal; Magnus Heurlin; Lars Samuelson; Magnus T. Borgström; Mats-Erik Pistol; Arkady Yartsev

doi:10.1364/OL.38.001449

Reflection measurements to reveal the absorption in nanowire arrays

Nicklas Anttu^*, Azhar Iqbal, Magnus Heurlin, Lars Samuelson, Magnus T. Borgström, Mats-Erik Pistol, Arkady Yartsev

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

11 Citations (Scopus)

Abstract

The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

Original language	English
Pages (from-to)	1449-1451
Number of pages	3
Journal	Optics Letters
Volume	38
Issue number	9
DOIs	https://doi.org/10.1364/OL.38.001449
Publication status	Published - 2013
Externally published	Yes
MoE publication type	A1 Journal article-refereed

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10.1364/OL.38.001449

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title = "Reflection measurements to reveal the absorption in nanowire arrays",

abstract = "The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.",

author = "Nicklas Anttu and Azhar Iqbal and Magnus Heurlin and Lars Samuelson and Borgstr{\"o}m, \{Magnus T.\} and Mats-Erik Pistol and Arkady Yartsev",

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AU - Anttu, Nicklas

AU - Iqbal, Azhar

AU - Heurlin, Magnus

AU - Samuelson, Lars

AU - Borgström, Magnus T.

AU - Pistol, Mats-Erik

AU - Yartsev, Arkady

PY - 2013

Y1 - 2013

N2 - The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

AB - The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.

UR - https://www.scopus.com/pages/publications/84877141419

U2 - 10.1364/OL.38.001449

DO - 10.1364/OL.38.001449

M3 - Article

AN - SCOPUS:84877141419

SN - 0146-9592

VL - 38

SP - 1449

EP - 1451

JO - Optics Letters

JF - Optics Letters

IS - 9

ER -

Reflection measurements to reveal the absorption in nanowire arrays

Abstract

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