Abstract
The absorption of light is at the core of photovoltaic applications. For many nanostructure-based devices, an assessment of the absorption in the nanostructures is complicated by a thick, opaque substrate that prohibits transmission measurements. Here, we show how a single reflection measurement can be used for approximating the amount of light absorbed in vertical semiconductor nanowire arrays.
Original language | English |
---|---|
Pages (from-to) | 1449-1451 |
Number of pages | 3 |
Journal | Optics Letters |
Volume | 38 |
Issue number | 9 |
DOIs | |
Publication status | Published - 2013 |
Externally published | Yes |
MoE publication type | A1 Journal article-refereed |