Quasi-Steady-State Measurement of Exciton Diffusion Lengths in Organic Semiconductors

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Original language	English
Article number	024076
Journal	Physical Review Applied
Volume	17
DOIs	https://doi.org/10.1103/PhysRevApplied.17.024076
Publication status	Published - 28 Feb 2022
MoE publication type	A1 Journal article-refereed

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title = "Quasi-Steady-State Measurement of Exciton Diffusion Lengths in Organic Semiconductors",

author = "Riley, \{Drew B.\} and Sandberg, \{Oskar J.\} and Wei Li and Paul Meredith and Ardalan Armin",

year = "2022",

month = feb,

day = "28",

doi = "10.1103/PhysRevApplied.17.024076",

language = "English",

volume = "17",

journal = "Physical Review Applied",

issn = "2331-7019",

publisher = "American physical society",

}

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T1 - Quasi-Steady-State Measurement of Exciton Diffusion Lengths in Organic Semiconductors

AU - Riley, Drew B.

AU - Sandberg, Oskar J.

AU - Li, Wei

AU - Meredith, Paul

AU - Armin, Ardalan

PY - 2022/2/28

Y1 - 2022/2/28

UR - https://doi.org/10.1103/PhysRevApplied.17.024076

U2 - 10.1103/PhysRevApplied.17.024076

DO - 10.1103/PhysRevApplied.17.024076

M3 - Article

SN - 2331-7019

VL - 17

JO - Physical Review Applied

JF - Physical Review Applied

M1 - 024076

ER -