Pore space characterization of coating layers

Martti Toivakka, Kjell Nyfors

    Research output: Chapter in Book/Conference proceedingConference contributionScientificpeer-review

    7 Citations (Scopus)


    Although coating and pore structures are commonly discussed in context of paper coating performance, the actual microscopic geometry of the void space still remains largely unknown.  A technique to partition a void space of porous material into unambiguously defined collection of individual pores is presented.  The characterization technique is based on 3-​dimensional image anal., and it can be applied to both exptl. and model packing data.  The technique produces useful new information of microscopic properties of pore spaces including distributions of pore size, surface area, pore connectivity, pore surface-​to-​vol. ratio, throat-​to-​surface area ratio, as well as fractal structural parameters.  Addnl., the technique creates a topol. model of the pore space that can be used as a starting point for predictions of transport processes in porous structures, e.g. short time absorption of printing inks.  Basic ideas and accuracy of the characterization technique are demonstrated by analyzing ordered lattice packings of cubic and hexagonal arrangements.  Pore spaces in random packings of mono- and polydisperse spherical particles are characterized.  The results quantify differences in pore structures caused by changes in particle size distributions.  An understanding of microscopic pore structures in coating layers enables the papermaker to improve and optimize coating formulations by using, e.g., pigment-​blending.
    Original languageUndefined/Unknown
    Title of host publication2000 Tappi coating conference : proceedings
    Editors TAPPI
    PublisherTAPPI Press
    ISBN (Print)9780898529647
    Publication statusPublished - 2000
    MoE publication typeA4 Article in a conference publication
    Eventconference; 2000-05-01; 2000-05-04 - TAPPI Coating Conference
    Duration: 1 May 20004 May 2000


    Conferenceconference; 2000-05-01; 2000-05-04

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