ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE

JPK PELTONEN, PS HE, JB ROSENHOLM

Research output: Contribution to journal › Article › Scientific › peer-review

52 Citations (Scopus)

Original language	English
Pages (from-to)	7637-7642
Journal	Journal of the American Chemical Society
Volume	114
Issue number	20
Publication status	Published - 23 Sept 1992
MoE publication type	A1 Journal article-refereed

Keywords

@article{b3bb56e215094fec9f6eadc75dae93bb,

title = "ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE",

keywords = "atomic force microscopy (AFM), Langmuir-Blodgett film, defect",

author = "JPK PELTONEN and PS HE and JB ROSENHOLM",

year = "1992",

month = sep,

day = "23",

language = "English",

volume = "114",

pages = "7637--7642",

journal = "Journal of the American Chemical Society",

issn = "0002-7863",

publisher = "American Chemical Society",

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T1 - ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE

AU - PELTONEN, JPK

AU - HE, PS

AU - ROSENHOLM, JB

PY - 1992/9/23

Y1 - 1992/9/23

KW - atomic force microscopy (AFM)

KW - Langmuir-Blodgett film

KW - defect

M3 - Article

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VL - 114

SP - 7637

EP - 7642

JO - Journal of the American Chemical Society

JF - Journal of the American Chemical Society

IS - 20

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