ORDER AND DEFECTS OF LANGMUIR-BLODGETT-FILMS DETECTED WITH THE ATOMIC FORCE MICROSCOPE

JPK PELTONEN, PS HE, JB ROSENHOLM

Research output: Contribution to journalArticleScientificpeer-review

51 Citations (Scopus)
Original languageEnglish
Pages (from-to)7637-7642
JournalJournal of the American Chemical Society
Volume114
Issue number20
Publication statusPublished - 23 Sept 1992
MoE publication typeA1 Journal article-refereed

Keywords

  • atomic force microscopy (AFM)
  • Langmuir-Blodgett film
  • defect

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