Original language | English |
---|---|
Pages (from-to) | U475-U475 |
Journal | Abstracts of Papers of the American Chemical Society |
Volume | 218 |
Publication status | Published - 22 Aug 1999 |
MoE publication type | O2 Other |
Keywords
- atomic force microscopy (AFM)
JPK Peltonen, M Paajanen, J Lekkala
Research output: Contribution to journal › Meeting Abstract › peer-review
Original language | English |
---|---|
Pages (from-to) | U475-U475 |
Journal | Abstracts of Papers of the American Chemical Society |
Volume | 218 |
Publication status | Published - 22 Aug 1999 |
MoE publication type | O2 Other |