Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy

Joona-Pekko Kakko; Antti Matikainen; Nicklas Anttu; Sami Kujala; Henrik Mäntynen; Vladislav Khayrudinov; Anton Autere; Zhipei Sun; Harri Lipsanen

doi:10.1038/s41598-017-18193-1

Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy

Joona-Pekko Kakko^*, Antti Matikainen, Nicklas Anttu, Sami Kujala, Henrik Mäntynen, Vladislav Khayrudinov, Anton Autere, Zhipei Sun, Harri Lipsanen

^*Corresponding author for this work

Research output: Contribution to journal › Article › Scientific › peer-review

6 Citations (Scopus)

Abstract

A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to red-shift with increasing NW diameter in the measured spectra. The peak was assigned to scattering from the TE₀₁ optical mode and the valley was an indication of the HE₁₁ mode, based on finite-element and scattering matrix method simulations. The cross-polarization method can be used to experimentally determine the spectral positions of the TE₀₁ and HE₁₁ optical modes. The modes are significantly more visible in comparison to conventional reflectance measurements. The method can be beneficial in the characterization of NW solar cells, light-emitting diodes and lasers where precise mode control is required.

Original language	English
Article number	17790
Journal	Scientific Reports
Volume	7
DOIs	https://doi.org/10.1038/s41598-017-18193-1
Publication status	Published - Dec 2017
Externally published	Yes
MoE publication type	A1 Journal article-refereed

Access to Document

10.1038/s41598-017-18193-1

Cite this

@article{5af020b626ed485a8f53ac3fa4eac2c7,

title = "Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy",

abstract = "A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to red-shift with increasing NW diameter in the measured spectra. The peak was assigned to scattering from the TE01 optical mode and the valley was an indication of the HE11 mode, based on finite-element and scattering matrix method simulations. The cross-polarization method can be used to experimentally determine the spectral positions of the TE01 and HE11 optical modes. The modes are significantly more visible in comparison to conventional reflectance measurements. The method can be beneficial in the characterization of NW solar cells, light-emitting diodes and lasers where precise mode control is required.",

author = "Joona-Pekko Kakko and Antti Matikainen and Nicklas Anttu and Sami Kujala and Henrik M{\"a}ntynen and Vladislav Khayrudinov and Anton Autere and Zhipei Sun and Harri Lipsanen",

note = "Publisher Copyright: {\textcopyright} 2017 The Author(s).",

year = "2017",

month = dec,

doi = "10.1038/s41598-017-18193-1",

language = "English",

volume = "7",

journal = "Scientific Reports",

issn = "2045-2322",

publisher = "Nature Research",

}

TY - JOUR

T1 - Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy

AU - Kakko, Joona-Pekko

AU - Matikainen, Antti

AU - Anttu, Nicklas

AU - Kujala, Sami

AU - Mäntynen, Henrik

AU - Khayrudinov, Vladislav

AU - Autere, Anton

AU - Sun, Zhipei

AU - Lipsanen, Harri

PY - 2017/12

Y1 - 2017/12

N2 - A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to red-shift with increasing NW diameter in the measured spectra. The peak was assigned to scattering from the TE01 optical mode and the valley was an indication of the HE11 mode, based on finite-element and scattering matrix method simulations. The cross-polarization method can be used to experimentally determine the spectral positions of the TE01 and HE11 optical modes. The modes are significantly more visible in comparison to conventional reflectance measurements. The method can be beneficial in the characterization of NW solar cells, light-emitting diodes and lasers where precise mode control is required.

AB - A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to red-shift with increasing NW diameter in the measured spectra. The peak was assigned to scattering from the TE01 optical mode and the valley was an indication of the HE11 mode, based on finite-element and scattering matrix method simulations. The cross-polarization method can be used to experimentally determine the spectral positions of the TE01 and HE11 optical modes. The modes are significantly more visible in comparison to conventional reflectance measurements. The method can be beneficial in the characterization of NW solar cells, light-emitting diodes and lasers where precise mode control is required.

UR - http://www.scopus.com/inward/record.url?scp=85038613747&partnerID=8YFLogxK

U2 - 10.1038/s41598-017-18193-1

DO - 10.1038/s41598-017-18193-1

M3 - Article

C2 - 29259279

AN - SCOPUS:85038613747

SN - 2045-2322

VL - 7

JO - Scientific Reports

JF - Scientific Reports

M1 - 17790

ER -

Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy

Abstract

Access to Document

Other files and links

Fingerprint

Cite this