Measurement of Nanowire Optical Modes Using Cross-Polarization Microscopy

Joona-Pekko Kakko*, Antti Matikainen, Nicklas Anttu, Sami Kujala, Henrik Mäntynen, Vladislav Khayrudinov, Anton Autere, Zhipei Sun, Harri Lipsanen

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

6 Citations (Scopus)


A method to detect optical modes from vertical InGaAs nanowires (NWs) using cross-polarization microscopy is presented. Light scattered from the optical modes in the NWs is detected by filtering out the polarized direct reflection with a crossed polarizer. A spectral peak and a valley were seen to red-shift with increasing NW diameter in the measured spectra. The peak was assigned to scattering from the TE01 optical mode and the valley was an indication of the HE11 mode, based on finite-element and scattering matrix method simulations. The cross-polarization method can be used to experimentally determine the spectral positions of the TE01 and HE11 optical modes. The modes are significantly more visible in comparison to conventional reflectance measurements. The method can be beneficial in the characterization of NW solar cells, light-emitting diodes and lasers where precise mode control is required.

Original languageEnglish
Article number17790
JournalScientific Reports
Publication statusPublished - Dec 2017
Externally publishedYes
MoE publication typeA1 Journal article-refereed


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