Abstract
In this work, we measure the hole mobility in the model polymer system poly(3-hexylthiophene-2,5-diyl) by using different measurement techniques. Our main purpose is to determine how the recently developed charge extraction by a linearly increasing voltage technique for metal-insulator-metal devices (MIM-CELIV) compares to other commonly used methods, such as space charge limited currents and time-of-flight. Our findings suggest that the MIM-CELIV technique gives a slightly lower mobility than the other techniques, which is understandable given that the method measures the mobility of relaxed charge carriers in the dark unlike, for example, time-of-flight where charge carriers are photogenerated. In addition, we scrutinize the accuracy and reliability of the techniques used, showing that differences in mobility smaller than a factor of two are not detectable unless statistics from many devices are available.
| Original language | English |
|---|---|
| Article number | 065203 |
| Journal | AIP Advances |
| Volume | 10 |
| Issue number | 6 |
| DOIs | |
| Publication status | Published - 2 Jun 2020 |
| MoE publication type | A1 Journal article-refereed |
Funding
Financial support from the Jane & Aatos Erkko Foundation (Project ASPIRE) and the Scientia Aboensis collaboration is acknowledged. S.D. acknowledges funding from the Vilho, Yrjö, and Kalle Väisälä foundation. M.N. acknowledges funding from the Academy of Finland (Project No. 326000).
Keywords
- CELIV
- Charge transport
- Charge carrier mobility
- SCLC
- Time-of-flight
- Photo-CELIV
- MIM-CELIV
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