Defects in bilayer silica and graphene: common trends in diverse hexagonal two-dimensional systems

Torbjörn Björkman, Simon Kurasch, Ossi Lehtinen, Jani Kotakoski, Oleg V. Yazyev, Anchal Srivastava, Viera Skakalova, Jurgen H. Smet, Ute Kaiser, Arkady V. Krasheninnikov

Research output: Contribution to journalArticleScientificpeer-review

59 Citations (Scopus)
Original languageUndefined/Unknown
Pages (from-to)
JournalScientific Reports
Volume3
DOIs
Publication statusPublished - 2013
MoE publication typeA1 Journal article-refereed

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