Characterizing ultrathin and thick organic layers by surface plasmon resonance three-wavelength and waveguide mode analysis

Niko Granqvist, Huamin Liang, Terhi Laurila, Janusz Sadowski, Marjo Yliperttula, Tapani Viitala*

*Corresponding author for this work

Research output: Contribution to journalArticleScientificpeer-review

50 Citations (Scopus)

Fingerprint

Dive into the research topics of 'Characterizing ultrathin and thick organic layers by surface plasmon resonance three-wavelength and waveguide mode analysis'. Together they form a unique fingerprint.

Engineering

Keyphrases

Material Science