Applications of ToF-SIMS in surface chemistry analysis of lignocellulosic biomass: a review

Hong Yan Mou, Wu Shubin, Pedro Fardim

    Research output: Contribution to journalReview Article or Literature Reviewpeer-review

    7 Citations (Scopus)


    Time-of-flight secondary-ion mass spectrometry (ToF-SIMS) is an advanced surface-sensitive technique that can provide both spectral and imaging information about materials. Recently, ToF-SIMS has been used for advanced studies of lignocellulosic biomass. In the current article, the application of ToF-SIMS to the characterization of the surface chemical composition and distribution of biomass components in lignocelluloses is reviewed. Moreover, extended applications of ToF-SIMS in the study of pretreatments, modification of biomaterials, and enzyme activity of lignocellulosic materials are presented and discussed. Sample preparation prior to ToF-SIMS analysis and subsequent interpretation of results is a critical factor in ensuring reliable results. The focus of this review is to give a comprehensive understanding of and offer new hints about the effects of processing conditions on the surface chemistry of lignocellulosic biomass.
    Original languageUndefined/Unknown
    Pages (from-to)5581–5599
    Issue number2
    Publication statusPublished - 2016
    MoE publication typeA2 Review article in a scientific journal


    • Lignocellulosic biomass
    • biomaterials
    • Biomass pretreatment
    • ToF-SIMS
    • Surface chemistry

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