Analysis of trace elements in trunk wood by thick-target PIXE using dry ashing for preconcentration

Leo Harju, Jan-Olof Lill, Kjell-Erik Saarela, Sven-Johan Heselius, Fredrik Joachim Hernberg, Alf Lindroos

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    Abstract

    Thick-target Particle Induced X-ray Emission (TTPIXE) was used for the quantitative determination of trace-element concentrations in trunk wood. The wood samples were preconcentrated by dry ashing to improve the reliability of the sampling and the sensitivity of the analytical method. Samples of Scots pine (Pinus sylvestris) and Norway spruce (Picea abies) were collected from a polluted area (Harjavalta) as well as from a relatively nonpolluted area (Merimasku) in southwestern Finland. The elements studied were P, S, K, Ca, Mn, Fe, Ni, Cu, Pb, Rb, Sr, Ba, Cd and Ag. TTPIXE combined with dry ashing is a sensitive and reliable analytical technique for most elements studied. The method was validified by using several certified reference materials and also by ICP-MS analysis. Due to the low ash content (0.2-0.4%) in wood a high preconcentration factor can be obtained. Differences in trace-element uptake were observed between the two tree species studied. Trunk wood from the polluted area contained higher concentrations of heavy metal ions.
    Original languageUndefined/Unknown
    Pages (from-to)523–528
    Number of pages6
    JournalFresenius' Journal of Analytical Chemistry
    Volume358
    Issue number4
    Publication statusPublished - 1997
    MoE publication typeA1 Journal article-refereed

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