3D label free bio-transfer standards

  • Miikka Järvinen
  • , Tuomas Vainikka
  • , Tapani Viitala
  • , Carlos Bermudez
  • , Roger Artigas
  • , Anton Nolvi
  • , Pol Martinez
  • , Niklas Sandler
  • , Edward Hæggström
  • , Ivan Kassamakov*
  • *Corresponding author for this work

    Research output: Chapter in Book/Conference proceedingPublished conference proceedingScientificpeer-review

    Abstract

    Two kinds of 3D label free Bio-Transfer-Standards (BTS) have been further developed at the University of Helsinki (UH). The first one, NanoRuler, is a staircase BTS featuring eight fatty acid bilayers which allows vertical calibration in the range of 5 to 40 nm. The second one, NanoStar, is a V-shaped BTS featuring two 5 nm tall bilayers that overlap at 10° angle. This standard enables the determination of the Instrument Transfer Function (ITF). A stability test was conducted on the BTSs, during which the standards were stored in laboratory conditions, and were profiled each week. Profiling was done using a custom-built Scanning White Light Interferometer (SWLI). The stability of NanoStar was ± 0.3 nm, and of NanoRuler ± 0.5 nm to ± 2.5 nm. The BTSs maintained their specified properties for at least six months and therefore allow vertical calibration and ITF determination. In addition, changes in surface morphology of one NanoRuler subjected to water immersion are presented. This paper reports intermediate findings during an ongoing stability test that will run for 24 months.

    Original languageEnglish
    Title of host publicationOptical Metrology and Inspection for Industrial Applications V
    EditorsToru Yoshizawa, Song Zhang, Sen Han, Sen Han
    PublisherSPIE, The International Society for Optical Engineering
    ISBN (Electronic)9781510622364
    ISBN (Print)9781510622364
    DOIs
    Publication statusPublished - 2018
    MoE publication typeA4 Article in a conference publication
    EventOptical Metrology and Inspection for Industrial Applications V 2018 - Beijing, China
    Duration: 11 Oct 201813 Oct 2018

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume10819
    ISSN (Print)0277-786X
    ISSN (Electronic)1996-756X

    Conference

    ConferenceOptical Metrology and Inspection for Industrial Applications V 2018
    Country/TerritoryChina
    CityBeijing
    Period11/10/1813/10/18

    Keywords

    • Bio transfer standard
    • Instrument Transfer Function
    • Nanometer scale metrology
    • Optical profiler
    • Scanning White Light Interferometry

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