3D label free bio-transfer standards

Miikka Järvinen, Tuomas Vainikka, Tapani Viitala, Carlos Bermudez, Roger Artigas, Anton Nolvi, Pol Martinez, Niklas Sandler, Edward Hæggström, Ivan Kassamakov*

*Corresponding author for this work

Research output: Chapter in Book/Conference proceedingConference contributionScientificpeer-review


Two kinds of 3D label free Bio-Transfer-Standards (BTS) have been further developed at the University of Helsinki (UH). The first one, NanoRuler, is a staircase BTS featuring eight fatty acid bilayers which allows vertical calibration in the range of 5 to 40 nm. The second one, NanoStar, is a V-shaped BTS featuring two 5 nm tall bilayers that overlap at 10° angle. This standard enables the determination of the Instrument Transfer Function (ITF). A stability test was conducted on the BTSs, during which the standards were stored in laboratory conditions, and were profiled each week. Profiling was done using a custom-built Scanning White Light Interferometer (SWLI). The stability of NanoStar was ± 0.3 nm, and of NanoRuler ± 0.5 nm to ± 2.5 nm. The BTSs maintained their specified properties for at least six months and therefore allow vertical calibration and ITF determination. In addition, changes in surface morphology of one NanoRuler subjected to water immersion are presented. This paper reports intermediate findings during an ongoing stability test that will run for 24 months.

Original languageEnglish
Title of host publicationOptical Metrology and Inspection for Industrial Applications V
EditorsToru Yoshizawa, Song Zhang, Sen Han, Sen Han
PublisherSPIE, The International Society for Optical Engineering
ISBN (Electronic)9781510622364
ISBN (Print)9781510622364
Publication statusPublished - 2018
MoE publication typeA4 Article in a conference publication
EventOptical Metrology and Inspection for Industrial Applications V 2018 - Beijing, China
Duration: 11 Oct 201813 Oct 2018

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X


ConferenceOptical Metrology and Inspection for Industrial Applications V 2018


  • Bio transfer standard
  • Instrument Transfer Function
  • Nanometer scale metrology
  • Optical profiler
  • Scanning White Light Interferometry


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