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Gaadha Chariyarupadannayil Sudheerbabu

 https://orcid.org/0000-0001-5883-8373
20202025

Research activity per year

  • 4 Published conference proceeding
  • 1 Chapter
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Published conference proceeding

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  • 2025

    Visual Spectrum-Based Fault Localization for Python Programs Based on the Differentiation of Execution Slices

    Khan, S., Sudheerbabu, G., Elena Staicu, B., Ahmad, T. & Truscan, D., 16 Apr 2025, 2025 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2025. Fasolino, A. R., Panichella, S., Aleti, A. & Mesbah, A. (eds.). IEEE, p. 217-225 (2025 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2025).

    Research output: Chapter in Book/Conference proceeding › Published conference proceeding › Scientific › peer-review

    13 Downloads (Pure)
  • 2024

    Iterative Optimization of Hyperparameter-based Metamorphic Transformations

    Sudheerbabu, G., Ahmad, T., Truscan, D., Vain, J. & Porres, I., 17 Sept 2024, Proceedings - 2024 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2024. IEEE, p. 13-20 (Proceedings - 2024 IEEE International Conference on Software Testing, Verification and Validation Workshops, ICSTW 2024).

    Research output: Chapter in Book/Conference proceeding › Published conference proceeding › Scientific › peer-review

  • Localizer: A Visual Debugging Assistant for Python Programs

    Khan, S., Sudheerbabu, G., Truscan, D. & Ahmad, T., 13 Sept 2024, DEBT 2024 - Proceedings of the 2nd ACM International Workshop on Future Debugging Techniques, Co-located with: ISSTA 2024. Boix, E. G. & Scholliers, C. (eds.). New York, NY, USA: ACM, p. 34–35 (DEBT 2024 - Proceedings of the 2nd ACM International Workshop on Future Debugging Techniques, Co-located with: ISSTA 2024).

    Research output: Chapter in Book/Conference proceeding › Published conference proceeding › Scientific › peer-review

    Open Access
    File
    6 Downloads (Pure)
  • 2022

    A Two-phase Metamorphic Approach for Testing Industrial Control Systems

    Sudheerbabu, G., Ahmad, T., Sebek, F., Truscan, D., Vain, J. & Porres, I., 2022, 2022 IEEE 27th International Conference on Emerging Technologies and Factory Automation (ETFA). IEEE, (IEEE International Conference on Emerging Technologies and Factory Automation, ETFA; vol. 2022-September).

    Research output: Chapter in Book/Conference proceeding › Published conference proceeding › Scientific › peer-review

    Open Access
    4 Citations (Scopus)