Analysis of trace elements in trunk wood by thick-target PIXE using dry ashing for preconcentration

A1 Journal article (refereed)


Internal Authors/Editors


Publication Details

List of Authors: Leo Harju, Jan-OlofLill, Kjell-Erik Saarela, Sven-Johan Heselius, Fredrik Joachim Hernberg, Alf Lindroos
Publisher: SPRINGER VERLAG
Publication year: 1997
Journal: Fresenius' Journal of Analytical Chemistry
Journal acronym: FRESEN J ANAL CHEM
Volume number: 358
Issue number: 4
Start page: 523
End page: 528
Number of pages: 6
ISSN: 0937-0633


Abstract

Thick-target Particle Induced X-ray Emission (TTPIXE) was used for the quantitative determination of trace-element concentrations in trunk wood. The wood samples were preconcentrated by dry ashing to improve the reliability of the sampling and the sensitivity of the analytical method. Samples of Scots pine (Pinus sylvestris) and Norway spruce (Picea abies) were collected from a polluted area (Harjavalta) as well as from a relatively nonpolluted area (Merimasku) in southwestern Finland. The elements studied were P, S, K, Ca, Mn, Fe, Ni, Cu, Pb, Rb, Sr, Ba, Cd and Ag. TTPIXE combined with dry ashing is a sensitive and reliable analytical technique for most elements studied. The method was validified by using several certified reference materials and also by ICP-MS analysis. Due to the low ash content (0.2-0.4%) in wood a high preconcentration factor can be obtained. Differences in trace-element uptake were observed between the two tree species studied. Trunk wood from the polluted area contained higher concentrations of heavy metal ions.

Last updated on 2019-21-09 at 03:07