Determination of Charge-Carrier Mobility and Built-In Potential in Thin-Film
Organic M-I-M Diodes from Extraction-Current Transients

A1 Journal article (refereed)


Internal Authors/Editors


Publication Details

List of Authors: Staffan Dahlström, Oskar J. Sandberg, Mathias Nyman, Ronald Österbacka
Publisher: American Physical Society
Publication year: 2018
Journal: Physical Review Applied
Journal acronym: Phys. Rev. Applied
Volume number: 10
Issue number: 5
Start page: 054019-1
End page: 054019-8


Abstract

We have extended the Charge Extraction by a Linearly Increasing Voltage (CELIV) technique for

determination of the built-in potential and the charge-carrier mobility in thin-film metal-insulator-metal

(M-I-M) diodes. The validity of the presented analytical theory is verified by drift-diffusion simulations

and experimentally demonstrated on organic solar cells. In contrast to the original CELIV theory, which

assumes a uniform charge-carrier distribution in the active layer of the device, here we derive an analytical

expression for determining the built-in potential and mobility in the case of a nonuniform charge-carrier

distribution where charges have diffused into the active layer from the contacts. The extended CELIV theory

is applicable on all thin-film M-I-M diodes, e.g., organic solar cells. Drift-diffusion simulations show

that the error for mobility estimation can be an order of magnitude if not correcting for the carrier profile.


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