Model-Based Testing using System vs. Test Models - What is the Difference?

A4 Conference proceedings


Internal Authors/Editors


Publication Details

List of Authors: Malik Q, Jääskeläinen A, Virtanen H, Katara M, Abbors F, Truscan D, Lilius J
Editors: Roy Sterritt, Brandon Eames, Jonathan Sprinkle
Publisher: IEEE Computer Society
Publication year: 2010
Publisher: IEEE
Book title: 2010 17th IEEE International Conference and Workshops on the Engineering of Computer-Based Systems
Start page: 291
End page: 299
ISBN: 978-0-7695-4005-4

Last updated on 2019-15-10 at 03:14